Carnegie Mellon University
March 10, 2017

Singh and De Graef's work featured on cover of Microscopy & MicroAnalysis

MSE Ph.D. candidate, Saransh Singh and Professor Marc De Graef published an article in Microscopy & MicroAnalysis about automated indexing of electron channeling patterns. One of the figures was used on the cover of the February issue of the journal. The cover image depicts a simulated false color 20 kV electron channeling pattern for Si, with the [110] zone axis in the lower right; the scattered intensity is represented on a color scale from deep green to light blue, and bandedges are highlighted in red using a Prewitt edge filter. The illumination cone semi-angle spans 11.42°. A high resolution version of this figure can be downloaded from here. This research was supported by an Air Force Office of Scientific Research (AFOSR) MURI program (contract \# FA9550-12-1-0458).