Yoosuf N. Picard
Associate Research Professor of Materials Science and Engineering
Professor Picard obtained a B.S. in Mechanical Engineering from Louisiana Tech University in 2001 and a Ph.D. in Materials Science and Engineering from the University of Michigan in 2006. During his graduate career, he was a Microsystems Engineering and Science Applications Fellow at Sandia National Laboratories where he researched focused ion beam applications as well as pulsed laser ignition phenomenon in energetic thin films. Following his doctoral research on materials modifications by femtosecond lasers, he was a postdoctoral research associate at the U.S. Naval Research Lab (NRL), where he conducted electron microscopy studies of GaN devices, SiC thin films, and metal-oxide nanowires. He was subsequently hired as a staff scientist at NRL to carry out electron microscopy studies of metal alloy surfaces and magnetic metal-oxide thin films. He joined the faculty at Carnegie Mellon University (CMU) in 2009 as a research faculty member of the Materials Science and Engineering Department.
His research group develops and applies advanced electron microscopy methods for quantitative microstructural characterization and in situ analysis of nanoscale materials, devices and novel alloys. He is an active member of the Minerals, Metals and Materials Society (TMS), Microscopy Society of America (MSA) and Microanalysis Society (MAS). He currently serves as MAS director and a co-organizer for the 2012, 2014 and 2016 EBSD topical conference series hosted by MAS. He is also leader of the MSA “Electron Crystallography and Automated Mapping Techniques” focused interest group. He is Program Chair for the 2018 Microscopy and Microanalysis meeting. He serves on an educational ad hoc committee for TMS, and editor for the journal “Microscopy and Microanalysis.” At CMU, he advises the MSE Graduate Student Advisory Council and serves on the steering committee for the Energy Science Technology & Policy Master’s degree program.
EducationPh.D., University of Michigan
Transmission electron microscopy, scanning electron microscopy, electron channeling contrast imaging, electron backscatter diffraction, dislocation analysis in semiconducting materials and devices, structural analysis in nanoscale materials, atomic scale imaging/analysis of interfaces.
M. Moradi, M. Ng, T. Lee, J. Cao and Y.N. Picard, “Interface Microstructural Characterization of Al-Cu Laminates Fabricated by Electrically-assisted Roll Bonding” Journal of Micro and Nano-manufacturing, 5:3, 031001 (2017). DOI: 10.1115/1.4036149
M. D. Hecht, Y. N. Picard, B. A. Webler, “Coarsening of Inter- and Intra-granular Proeutectoid Cementite in an Initially Pearlitic 2C-4Cr Ultrahigh Carbon Steel” Metallurgical and Materials Transactions A, 48:5, 2320-2335 (2017). DOI: 10.1007/s11661-017-4012-2
E. Mataev, S. Rastogi, A. Madhusudan, J. Bone, N. Lamprinakos, Y.N. Picard, T. Cohen-Karni, “Synthesis of Group IV Nanowires on Graphene – The Case of Ge Nanocrawlers” Nano Letters, 16:8, 5267-5272 (2016). DOI: 10.1021/acs.nanolett.6b02451
J. Kwon, A.A. Sharma, C.-Y. Chen, A. Fantini, M. Jurczak, A. Herzing, J.A. Bain, Y.N. Picard, M. Skowronski, "Transient Thermometry and HRTEM Analysis of Filamentary Resistive Switches" Applied Materials and Interfaces, 8:31, 20176-20184 (2016). DOI: 10.1021/acsami.6b05034
M.D. Hecht, B.A. Webler, Y.N. Picard, “Digital Image Analysis to Quantify Carbide Networks in Ultrahigh Carbon Steels” Materials Characterization, 117, 134-143 (2016). DOI: 10.1016/j.matchar.2016.04.012