Picard receives Birks Award at Microscopy and Microanalysis Meeting-Department of Materials Science and Engineering - Carnegie Mellon University

Picard receives Birks Award at Microscopy and Microanalysis Meeting

Professor Yoosuf Picard was the recipient of the Birks Award for best contributed paper presented at the Microscopy and Microanalysis meeting. His paper was entitled “Future Prospects for SEM-based Defect Analysis using Fast Electrons.” This award is presented each year at the conference by the Microanalysis Society (MAS).