Recent Doctoral Theses-Department of Materials Science and Engineering - Carnegie Mellon University

2008 Doctoral Theses

David C. Berry
Ultrahigh Density Magnetic Recording Media: The A1 to L10 Phase Transformation in FePt and Related Ternary Alloy Films
Advisor: Katayun Barmak

Sukwon Choi
Observations and Simulations of Resistance Switching Behavior
Advisors: Paul Salvador and Marek Skowronski

Rodrigo Corbari
On a New Ironmaking Process to Produce Hydrogen and Reduce Energy Consumption
Advisor: Richard J. Fruehan

Patrick J. Fisher
Thin Film Growth and Structure Design in the BaO-SrO-TiO2 System
Advisors: Paul Salvador and Marek Skowronski

Pranita Kulkarni
Electrical and Optical Properties of Carbon Films
Advisor: Lisa Porter

Jaewon Lee
Evolution of Extended Defects in PVT-Grown 4H-SiC Single Crystals
Advisor: Marek Skowronski

Sukbin Lee
Microstructure-Property Relationships in Digitally Generated Three-Dimensional Two-Phase Liquid Phase Sintered Materials
Advisor: Anthony D. Rollett

Chao-Voon Samuel Lim
Length Scale Effect on the Microstructural Evolution of Cu Layers in a Roll-bonded CuNb Composite
Advisor: Anthony D. Rollett

Jeremiah MacSleyne
Moment Invariants for 2-D and 3-D Characterization of the Morphology of g Precipitates in Nickel-Base Superalloys
Advisor: Marc De Graef

Herbert M. Miller III
Influences of Processing and Composition on the Grain Boundary Character Distribution
Advisor: Gregory S. Rohrer

Saurav Nigam
Carrier Lifetimes in Silicon Carbide
Advisor: Marek Skowronski

Nitin M. Patel
Structure Property Relationships of Nitride Superlattice Hard Coatings Prepared by Pulsed Laser Deposition
Advisor: Paul Salvador

Christopher G. Roberts
Grain Growth and the Zener Pinning Phenomenon: A Computational and Experimental Investigation
Advisor: Anthony D. Rollett

Bryan A. Webler
A Study of the Processes During High Temperature Oxidation That Control Surface Hot Shortness in Copper-Containing Low-Carbon Steels
Advisor: Sridhar Seetharaman

Xuan Zhang
Extended Defects in 4H-SiC Homeoepitaxial Layers
Advisor: Marek Skowronski