X-Ray Central Facility-Department of Materials Science and Engineering - Carnegie Mellon University

Materials Characterization Facility - X-Ray Central Facility

Several x-ray devices are located within the Materials Characterization Facility.

Panalytical X’Pert Pro MPD X-Ray Diffractometer
The MPD uses focusing optics for analyzing powder and bulk materials. It has a PIXcel detector for rapid scanning.
                      |  Instrument rate = $40. per sample  |

Panalytical X’Pert Pro MRD X-Ray Diffractometer
The MRD uses lens, mirror and high resolution optics for parallel beam techniques. It is used for thin film analysis, pole figures, stress measurements, in-plane scans, reflectivity, rocking curves and reciprocal space maps.
                      |  Instrument rate = $40. per sample  |

Panalytical MiniPal4 ED-XRF Spectrometer
The MiniPal is an Energy Dispersive X-Ray Fluorescence device.

Additional X-Ray Equipment
The Materials Science and Engineering Department also maintains x-ray instruments in laboratories outside the central facility.

  • Rigaku/MSC Small Angle X-Ray Scattering (SAXS)

  • 3D Computed Tomography

  • Radiography Equipment


For information contact: 
Elizabeth Clark
Materials Characterization Facilities (MCF) Specialist


Any published research using these MCF instruments should include the following acknowledgement statement: “The authors acknowledge use of the Materials Characterization Facility at Carnegie Mellon University supported by grant MCF-677785.”