Scanning Probe Microscopy-Department of Materials Science and Engineering - Carnegie Mellon University

Materials Characterization Facility - Scanning Probe Microscopy

The facility has three scanning probe microscopes.

NT-MDT Solver NEXT SPM
The most general purpose microscope, which is capable of Contact AFM, Lateral Force Microscopy, Phase Contrast Microscopy, Magnetic Force Microscopy, Electrostatic Force Microscopy, Kelvin Probe Microscopy, Adhesion Force Imaging, Spreading Resistance Imaging (SRI), Scanning Capacitance microscopy, Piezoresponse Microscopy, and STM Scanning Tunneling Microscopy (STM). This microscope also permits imaging in liquid and includes a high resolution scanner.
     |  Instrument rate = $40. per hour  |

NT-MDT NTegra SPM
This microscope is capable of the same modes of operation that the Solver NEXT can use, but it has swappable heads and stages that allow it some more flexibility. In addition to the capabilities of the Solver NEXT, the NTegra is capable of imaging a sample immersed in liquid, High Resolution AFM, High-voltage (up to 40V) Electrical and Piezoresponse Microscopy. This microscope also has a signal breakout box allowing the user to tap into the signals coming from the microscope and even provide their own input signals in some situations, allowing its use as a flexible probe station.
     |  Instrument rate = $40. per hour  |

NT-MDT Spectra AFM/Raman
This microscope is an AFM with integral Raman capability. The laser in use is a 532nm green laser. This can be run independently, for getting a Raman spectrum or for Raman mapping. It can be combined with a top-view AFM probe for co-localized AFM and Raman. The microscope is Tip-Enhanced Raman Spectroscopy (TERS) capable with the proper probe and sample combination.

This microscope also has the latest control system from NT-MDT, which allows mapping for Stiffness, Surface Adhesion, and Deformation at the scale of the AFM tip (typically 15nm-30nm). In addition, this control hardware allows for single-pass Kelvin Probe measurements, as opposed to the two-pass method employed by the Solver NEXT and NTegra systems.
     |  Instrument rate = $40. per hour  |

For information contact:

Adam Wise
Scanning Probe and Facilities Specialist


Any published research using these MCF instruments should include the following acknowledgement statement: “The authors acknowledge use of the Materials Characterization Facility at Carnegie Mellon University supported by grant MCF-677785.”