To be published in Landolt-Börnstein New Series, 2014.
Chapter from Landolt-Börnstein Review: Scanning Tunneling Microscopy
R. M. Feenstra1 and Saw Wai Hla2
1Department of Physics, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213
2Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439
Introduction
Applications of scanning tunneling microscopy (STM) to surfaces of both metals and semiconductors have rapidly expanded during the last fifteen years. Initial STM studies in both cases focused on structural imaging as well as measurement of electronic properties using scanning tunneling spectroscopy (STS). That early work was primarily for low-index surfaces, as reviewed by Hamers. Later studies included a much greater range of surfaces and measurement techniques. The following literature overview summarizes the STM/STS studies of crystalline surfaces of metals and semiconductors from 1997 to 2012. The elements and compounds are listed with alphabetical order, and within each material the topics are ordered from lower to higher index surfaces.
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